Measurement of Low Polarization Losses of a Semiconductor Material in Finished Diodes

Мұқаба

Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

A method for the measurement of semiconductor polarization losses in the depletion region of a finished diode is considered. It is shown that the measurement can be performed by comparing with a low-loss capacitor using general-purpose impedance meters in laboratories without stabilizing the microclimate and shielding the electromagnetic fields. To exclude the drift error under these conditions, multiple regular switching of the measurement object and low-loss capacitor is proposed. As a result, the polarization loss tangent of 1.9 × 10−4 was measured with an error of ±16%.

Авторлар туралы

E. Semyonov

Tomsk State University of Control Systems and Radioelectronics

Email: edwardsemyonov@narod.ru
634050, Tomsk, Russia

O. Malakhovskiy

JSC “Scientific-Research Institute of Semiconductor Devices

Хат алмасуға жауапты Автор.
Email: edwardsemyonov@narod.ru
634034, Tomsk, Russia

Әдебиет тізімі

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© Э.В. Семенов, О.Ю. Малаховский, 2023